Researcher Database

KAKIUCHI, Takuhiro

FacultyGraduate School of Science and Engineering Engineering for Production and Environment
PositionAssistant Professor
Last Updated :2019/05/22

Researcher Profile and Settings

Profile and Settings

Name

  • Name

    KAKIUCHI, Takuhiro

Affiliations

Affiliation & Job

  • Section

    Graduate School of Science and Engineering, Chemistry and Biology, Graduate School of Science and Engineering Chemistry and Biology
  • Job title

    Assistant Professor

Education, Etc.

Education

  • 20060400, 20080300, Graduate University for Advanced Studies, School of High Energy Accelerator Science , Department of Materials Structure Science
  • 20040400, 20060300, Ehime University, Graduate School of Science and Engineering
  • 20000400, 20040300, Ehime University, Department of Chemistry
  • 20080000, The Graduate University for Advanced Studies
  • 20040000, Ehime University, Faculty of Science

その他基本情報

Academic & Professional Experience

  • 20080400, 99990000, Assistant Professor, Ehime University

Research Activities

Research Areas, Etc.

Research Areas

  • Quantum beam science, Quantum beam science, Synchrotron radiation
  • Basic chemistry, Basic chemistry
  • Physics, Condensed matter physics I, Surface and interface
  • Materials chemistry, Device related chemistry, High dielectric material

Research Interests

  • Surface and Interface
  • Surface Physical Properties
  • Quantum chemistry
  • Physical properties of semiconductor surfaces
  • Structure Chemistry
  • Auger-electron spectroscopy
  • X-ray photoelectron spectroscopy
  • Coincidence spectroscopy
  • Surface Science

Book, papers, etc

Published Papers

  • Local valence electronic states of silicon (sub)oxides on HfO2/Si-(sub)oxide/Si(110) and HfSi2/Si-(sub)oxide/Si(110) Islands, Takuhiro Kakiuchi, Kyouhei Ikeda, Kazuhiko Mase, Shin-ichi Nagaoka, Surface Science, 681, 9, 17, 20190300
  • Direct Observations of Correlation between Si-2p Components and Surface States on Si(110)-16 x 2 Single-Domain Surface Using Si-L23VV Auger-Electron and Si-2p Photoelectron Coincidence Measurements, Kakiuchi Takuhiro, Yoshizaki Yuya, Kubota Hiroyuki, Sato Yuki, Nagaoka Shin-ichi, Mase Kazuhiko, JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 86, 5, 20170515, 0031-9015, 10.7566/JPSJ.86.054704
  • Site-Specific Electron-Ralaxation Caused by Si:2p Core-Level Photoionization: Comparison between F3FiCH2CH2Si(CH3)3 and Cl3SiCH2CH2Si(CH3)3 Vapors by Means of Photoelectron Auger Electron Coinsicence Spectroscopy, Shin-ichi Nagaoka, Takuhiro Kakiuchi, Joji Ohshita, Osamu Takahashi, and Yasumasa Hikosaka, J. Phys. Chem. A, 120, 9907, 9915, 20161100, 10.1021/acs.jpca.6b09399
  • Local Valence Electronic States and Valence-Band Maximum of Ultrathin Silicon Nitride Films on Si(111) Studied by Auger Photoelectron Coincidence Spectroscopy: Thickness and Interface Structure Dependence, Kakiuchi Takuhiro, Tahara Masashi, Mase Kazuhiko, Nagaoka Shin-ichi, JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 84, 4, 20150415, 0031-9015, 10.7566/JPSJ.84.044711
  • Decay Processes of Si 2s Core Holes in Si(111)-7 x 7 Revealed by Si Auger Electron Si 2s Photoelectron Coincidence Measurements, Mase Kazuhiko, Hiraga Kenta, Arae Sadanori, Kanemura Rui, Takano Yusaku, Yanase Kotaro, Ogashiwa Yosuke, Shohata Nariaki, Kanayama Noritsugu, Kakiuchi Takuhiro, Ohno Shinya, Sekiba Daiichiro, Okudaira Koji K., Okusawa Makoto, Tanaka Masatoshi, JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 83, 9, 20140900, 0031-9015, 10.7566/JPSJ.83.094704
  • 7, 374 , 380, 20140000
  • Attempts to Improve the Sensitivity and the Energy Resolution of an Analyzer for Auger Photoelectron Coincidence Spectroscopy and Electron Ion Coincidence Spectroscopy, S. Arae, R. Kanemura, K. Hiraga, Y. Oashira, K. Yanase, N. Kanayama, S. Ohno, T. Kakiuchi, K. Mase, K. K. Okudaira, M. Okusawa, and M. Tanaka, J. Vac. Soc. Jpn., 56, 507, 510, 20130900, 10.3131/jvsj2.56.507
  • Site-Specific Ion Desorption from Condensed F3SiD2CH2Si(CH3)3 Induced by Si-2p Core-Level Ionization Studied with Photoelectron Photoion Coincidence (PEPICO) Spectroscopy, Auger Photoelectron Coincidence Spectroscopy (APECS) and Auger Electron Coincidence, K. Mase, E. Kobayashi, A. Nambu, T. Kakiuchi, O. Takahashi, K. Tabayashi, J. Ohshita, S. Hashimoto, M. Tanaka, and S. Nagaoka, Surf. Sci., 607, 174, 180, 20130000, 10.1016/j.susc.2012.09.003
  • Study of Local Valence Electronic States of SiO2 Ultrathin Films Grown on Si(111) by Using Auger Photoelectron Coincidence Spectroscopy: Upward Shift of Valence-Band Maximum Depending on the Interface Structure, Kakiuchi Takuhiro, Fujita Narihiko, Mase Kazuhiko, Tanaka Masatoshi, JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 81, 7, 20120700, 0031-9015, 10.1143/JPSJ.81.074706
  • Local Valence Electronic States of SiO2 Ultrathin Films Grown on Si(100) Studied Using Auger Photoelectron Coincidence Spectroscopy: Observation of Upward Shift of Valence-Band Maximum as a Function of SiO2 Thickness, Kakiuchi Takuhiro, Fujita Narihiko, Mase Kazuhiko, Tanaka Masatoshi, Nagaoka Shin-ichi, JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 80, 8, 20110800, 0031-9015, 10.1143/JPSJ.80.084703
  • Surface-site-selective study of valence electronic states of a clean Si(111)-7x7 surface using Si L23VV Auger electron and Si 2p photoelectron coincidence measurements, Kakiuchi Takuhiro, Tahara Masashi, Hashimoto Shogo, Fujita Narihiko, Tanaka Masatoshi, Mase Kazuhiko, Nagaoka Shin-ichi, PHYSICAL REVIEW B, 83, 3, 20110124, 1098-0121, 10.1103/PhysRevB.83.035320
  • A Study to Control Chemical Reactions Using Si:2p Core Ionization: Site-Specific Fragmentation, S. Nagaoka, H. Fukuzawa, G. Prümper, M. Takemoto, O. Takahashi, K. Yamaguchi, T. Kakiuchi, K. Tabayashi, I. H. Suzuki, J. R. Harries, Y. Tamenori, and K. Ueda, J. Phys. Chem. A, 115, 8822, 8831, 20110700, 10.1021/jp203664r
  • Ion Desorption from Single-Walled Carbon Nanotubes Induced by Soft X-ray Illumination, Y. Mera, T. Fujiwara. K. Ishizaki, R. Xiang, J. Shiomi, S. Maruyama. T. Kakiuchi, K. Mase, and K. Maeda, Jpn. J. Appl. Phys., 49, 105104-1, 105104-5, 20100700, 10.1143/JJAP.49.105104
  • Surface-Site-Selective study of Valence Electronic Structures of Clean Si(100)-2×1 Using Si-L23VV Auger Electron - Si-2p Photoelectron Coincidence Spectroscopy, T. Kakiuchi, S. Hashimoto, N. Fujita, M. Tahara, K. Mase, and S. Nagaoka, J. Phys. Soc. Jpn., 79, 064714-1, 064714-4, 20100600
  • Topmost-surface-sensitive Si-2p photoelectron spectra of clean Si(100)-2×1 measured with photoelectron Auger coincidence spectroscopy Surface Science, T. Kakiuchi, S. Hashimoto, N. Fujita, M. Tahara, K. Mase, and S. Nagaoka, Surf. Sci., 604, L27, L30, 20100200, 0039-6028, 10.1016/j.susc.2010.02.005
  • Hydrogen ion desorption from amorphous carbon films induced by resonant core electron excitations, Y. Mera, S. Liang, T. Fujiwara, K. Ishizaki, T. Kakiuchi, K. Mase, E. Kobayashi, K. K. Okudaira, and K. Maeda, Nucl. Instrum. Methods Phys. Res. B, 268, 127, 130, 20101100, 0168-583X, 10.1016/j.nimb.2009.10.172
  • Auger-Electron Spectra of F3SiCH2CH2Si(CH3)3 Obtained by Using Monochromatized Synchrotron Radiation, S. Nagaoka, A. Nitta, Y. Tamenori, H. Fukuzawa, K. Ueda, O. Takahashi, T. Kakiuchi, Y. Kitajima, K. Mase, and I. H. Suzuki, J. Electron Spectrosc. Relat. Phenom., 175, 14, 20, 20090600, 10.1016/j.elspec.2009.06.006
  • Tunneling Effect in Antioxidant Reaction of Flavonoid, T. Kakiuchi, K. Mukai, K. Ohara, and S. Nagaoka, Bull. Chem. Soc. Jpn., 82, 216, 218, 20090800, 0009-2673|1348-0634, 10.1246/bcsj.82.216
  • Development of an Apparatus for High-Resolution Auger Photoelectron Coincidence Spectroscopy (APECS) and Electron Ion Coincidence (EICO) spectroscopy, Takuhiro KAKIUCHI, Shogo HASHIMOTO, Narihiko FUJITA, Kazuhiko MASE, Masatoshi TANAKA, Makoto OKUSAWA, The Vacuum society of JapanJournai of the Vacuum society of Japan, 51, 11, 749, 757, 20081000, 1882-2398|1882-4749, 10.3131/jvsj2.51.749
  • Construction and evaluation of a miniature electron ion coincidence analyzer mounted on a conflat flange with an outer diameter of 114 mm, T. Kakiuchi, E. Kobayashi, K. K. Okudaira, N. Fujita, M. Tanaka, K. Mase, The Japan society for analytical ChemistoryAnalytical Sciences, 24, 1, 87, 92, 20080100, 0910-6340|1348-2246, 10.2116/analsci.24.87
  • Kinetics of the reaction by vitamin E is regenerated which natural by vitamin C, Nagaoka Shin-ichi, Kakiuchi Takuhiro, Ohara Keishi, Mukai Kazuo, CHEMISTRY AND PHYSICS OF LIPIDS, 146, 1, 26, 32, 20070300, 0009-3084, 10.1016/j.chemphyslip.2006.12.001
  • Development of an electron electron ion coincidence analyzer for Auger photoelectron coincidence spectroscopy (APECS) and electron ion coincidence (EICO) spectroscopy, T. Kakiuchi, E. Kobayashi, N. Okada, K. Oyamada, M. Okusawa, K. K. Okudaira, and K. Mase, ElsevierJ. Electron. Spectros. Relat. Phenom., 161, 164, 171, 20070200, 10.1016/j.elspec.2007.02.018
  • Recent progress in coincidence studies on ion desorption induced by core excitation, E. Kobayashi, K. Mase, A. Nambu, J. Seo, S. Tanaka, T. Kakiuchi, K. K. Okudaira, S. Nagaoka, M. Tanaka, J. Phys. : Condens. Matter, 18, 30, S1389, S1408, 20060700, 0953-8984, 10.1088/0953-8984/18/30/S03
  • Site-specific fragmentation caused by Si:1s core-level photoionization of F3SiCH2CH2Si(CH3)3 vapor, NAGAOKA S., TAMENORI Y., HINO M., KAKIUCHI T., OHSHITA J., OKADA K., IBUKI T., SUZUKI I.h., Chem. Phys. Lett., 412, 4-6, 459, 463, 20050800, 0009-2614, 10.1016/j.cplett.2005.07.044
  • Total photoabsorption cross-sections of CF3SF5 in the C, F, and S K-shell regions, T. Ibuki, Y. Shimada, S. Nagaoka, A. Fujii, M. Hino, T. Kakiuchi, K. Okada, K. Tabayashi, T. Matsudo, Y. Yamana, I. H. Suzuki, and Y. Tamenori, Chem. Phys. Lett., 392, 303, 308, 20040600, 10.1016/j.cplett.2004.04.118

Conference Activities & Talks

  • 20190312
  • Influence of hafnium chemical state difference on initial silicon oxidation at interface between hafnium deposition and Si(100) substrate, KAKIUCHI Takuhiro、YAMASAKI Hideki、TSUKADA chie、YOSHIGOE Akitaka, 20181019
  • Oxygen adsorption and desorption of ultrathin Hafnium film on clean Si(100)-2×1 surface, KAKIUCHI Takuhiro, 20180911
  • Si-(sub)0xides selective local valence electronic states of HfSi2/Si-(sub)0xides/Si(110) and HfO2/Si-(sub)oxides/Si(110), Takuhiro Kakiuchi, Kyohei Ikeda, Kazuhiko Mase, and Shin-ichi Nagaoka, 20180822
  • Local Valence Electronic States Selected at Surface/Interface of Ultra-Thin Hafnium Silicide Films Grown on Si(110)-16×2 Single Domain Surface, KAKIUCHI Takuhiro, 20170314
  • 20170310, 招待有り
  • Interface-Selective Study of Local Valence Electronic States of Ultrathin Hf/SiO2/Si(110) and HfO2/SiO2/Si(110) Films, T. Kakiuchi, K. Ikeda, S. Nagaoka, K. Mase, 20161129
  • Surface and Interface Chemical-States and Local Valence Electronic Structures of Ultrathin SiO2 Films Fabricated on Clean Si(110)-16×2 Single Domain Surface, T. Kakiuchi, K. Ikeda, S. Nagaoka, K. Mase, 20160913
  • 20160319
  • Local Valence Electronic States at Interface of Hf and HfO2 Ultrathin Films Deposited on Clean Si(110)-16×2 Single Domain Surface , T. Kakiuchi, K. Ikeda, S. Nagaoka, K. Mase, 20160315
  • Local Valence Electronic State Shift Depending on Thickness of SiO2 Ultrathin Films Grown on Clean Si(110)-16×2 Single Domain Surface, T. Kakiuchi, K. Ikeda, S. Nagaoka, K. Mase, 20160315
  • 20151201
  • Hafnium adsorption on clean Si(110)-16×2 single domain surface studied by low energy electron diffraction and electron spectroscopy, T. Kakiuchi, T. Katuragi, Y. Nakano, A. Yooshigoe, S. Nagaoka, K. Mase, 20151201
  • Hydrogen adsorption on clean Si(110)-16×2 single domain surface studied by X-ray photoelectron and photoelectron-Auger-electron coincidence spectroscopies, T. Kakiuchi, Y. Nakano, S. Nagaoka, K. Mase, 20151201
  • Hafnium adsorption to clean Si(110)-16×2 single domain surface studied with photoelectron spectroscopy, T. Kakiuchi, T. Katsuragi, Y. Nakano, S. Nagaoka, K. Mase, International Conference on Electron Spectroscopy and Structure: ICESS-15, 20150928
  • Hydrogen adsorption to clean Si(110)-16×2 single domain surface and its chemical states, T. Kakiuchi, Y. Nakano, S. Nagaoka, K. Mase, International Conference on Electron Spectroscopy and Structure: ICESS-15, 20150928
  • Decay processes of Au-4f core holes studies by Au-N6,7VV Auger-electron Au-4f photoelectron coincidence measurements, H. Kodama, M. Tanaka, S. Ohno, T. Kakiuchi, K. Mase, K. K. Okudaira, M. Tanaka, S. Tanaka, 20150317
  • Hydrogen atom adsorption process to clean Si(110)-16×2 single domain surface and its surface property, T. Kakiuchi, Y. Nakano, S. Nagaoka, K. Mase, 20150317
  • Surface Structure and Local Valence Electronic states of Si(110)-16×2 surface after exposure to water: XPS and Auger-photoelectron coincidence study, T. Kakiuchi, S. Nishiura, J. Kawamoto, S. Nagaoka, K. Mase, Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2014), 20141208
  • 20141106
  • Dissociative adsorption of H2O on clean Si(110)-16×2 surface: change of surface property and one-dimensional structure, T. Kakiuchi, S. Nishiura, J. Kawamoto, S. Nagaoka, K. Mase, 20140921
  • 20140327
  • Surface Sensitive Si-2p Photoelectron Spectrum Measurements of Clean Si(110)-16×2 Surface, T. Kakiuchi and K. Mase, 20140318
  • 20140111
  • Atomic Structure of Si(110)-16×2 Studied by Auger Photoelectron Coincidence Spectroscopy (APECS) , T. Kakiuchi, Y. Yoshizaki, H. Kubota, Y. Sato, K. Mase, 9th International Symposium on Atomic Level Characterizations for New Materials and Devices ’13, 20131202
  • 20131126
  • 20131116, 招待有り
  • Atomic Structure and Local Valence Electronic States of Clean Si(110)-16×2 surface by using Photoelectron Auger-electron coincidence spectroscopy, T. Kakiuchi, Y. Yoshizaki, H. Kubota, Y. Sato, K. Mase, 20130924
  • 20130314
  • 20130314
  • Construction and Evaluation of Auger-Photoelectron Coincidence Apparatus at BL13 of HiSOR, T. Kakiuchi, Y. Sato, S. Hanaoka, S. Kajikawa, H. Hayashita, M. Ogawa, S. Arae, S. Wada, T. Sekitani, S. Nagaoka, M. Tanaka, and K. Mase, Progress in materials science and synchrotron radiation, 20130228
  • Study of Local Valence Electronic States of SiO2 Ultrathin Films Grown on Si Single Crystal by using Auger Photoelectron Coincidence Spectroscopy, Takuhiro Kakiuchi, 20121120, 招待有り
  • 20120918
  • Mechanism of highly charged Ar ions production induced by inner-shell ionization studied using Auger-electron – ion coincidence spectroscopy, T. Kakiuchi, S. Hanaoka, D. Tamaki, S. Fujiwara, Y. Yoshizaki, K. Mase, S. Nagaoka, International Conference on Many Particle Spectroscopy of Atoms, Molecules, Clusters and Surfaces, 20120827
  • Local valence electronic states of silicon nitride ultrathin films on Si(111) stud-ied by using Auger photoelectron coincidence spectroscopy (APECS), T. Kakiuchi, M. Tahara, S. Nagaoka, K. Mase, International Conference on Many Particle Spectroscopy of Atoms, Molecules, Clusters and Surfaces, 20120827
  • Attempts to Improve the Sensitivity and the Energy Resolution of an Analyzer for Auger Photoelectron Coincidence Spectroscopy and Electron Ion Coincidence Spectroscopy, 11th International Conference on Synchrotron Radiation Instrumentation, 20120709
  • Study of Highly Charged Ar Ions Formed by Electron-Impact Ionization, T. Kakiuchi, S. Hanaoka, K. Mase, S. Nagaoka, 28th Symposium on Chemical Kinetics and Dynamics, 20120606
  • 20120106
  • 20110920
  • Development of Coincidence Spectrometer for Study of Collision Dynamics between High-Energy Electron and Molecule, T. Ito, S. Inoue, M. Tahara, Y. Nakazato, H. Kubota, T. Kakiuchi, S. Nagaoka, K. Mase, 27th Symposium on Chemical Kinetics and Dynamics, 20110608
  • Local Valence Electronic Structure at Surface and interface of Si3N4 thermally grown on Si(111), T. Kakiuchi, M. Tahara, S. Nagaoka, K. Mase, 20110314
  • 20100914
  • 20100914
  • Development of Apparatus for Auger Electron - Ion Coincidence Spectroscopy and Auger Electron - Auger Electron Coincidence Spectroscopy in Gas Phase Using 5-keV Electron Gun, T. Kakiuchi, S. Inoue, M. Tahara, T. Itoh, H. Kubota, Y. Nakazato,S. Nagaoka, K. Mase, International Conference on Many Particle Spectroscopy of Atoms, Clusters & Surfaces MPS 2010, 20100800
  • Auger electron spectra of hydrogenated Si(111) obtained with Auger electron photoelectron coincidence measurements, T. Yamazaki, S. Hashimoto, T. Kakiuchi, K. Mase, M. Tanaka, International Conference on Many Particle Spectroscopy of Atoms, Clusters & Surfaces MPS 2010, 20100800
  • Site-selective ion desorption from CF3CH2OH dissociatively chemisorbed on Si(111) studied with photoelectron photoion coincidence (PEPICO) measurements, T. Yamazak, S. Hashimoto, T. Kakiuchi, K. Mase, S. Nagaoka, M. Tanaka, International Conference on Many Particle Spectroscopy of Atoms, Clusters & Surfaces MPS 2010, 20100800
  • Development of Multi Coincidence Spectrometer Using 5-keV Electron Gun, S. Inoue, M. Tahara, T. Kakiuchi, S. Nagaoka, K. Mase, 26th Symposium on Chemical Kinetics and Dynamics, 20100602
  • 20091107
  • 20091107
  • Study of local valence electronic states of Si3N4 grown on Si(111) and Si(001) using Auger photoelectron coincidence spectroscopy (APECS), T. Kakiuchi, M. Tahara, H. Ishida, K. Mase, S. Nagaoka, 11-th International Conference on Electronic Spectroscopy and Structure, 20091006
  • Surface-selective study of Si-L23VV Auger-electron and Si-2p photoelectron spectra of Si(100)-2×1 and Si(111)-7×7 using Auger-electron photoelectron coincidence spectroscopy (APECS), T. Kakiuchi, S. Hashimoto, N. Fujita, K. Mase, M. Tanaka, 11-th International Conference on Electronic Spectroscopy and Structure, 20091006
  • 20090921
  • Development of an Apparatus for Auger Photoelectron Coincidence Spectroscopy (APECS) and Electron Ion Coincidence (EICO) Spectroscopy for Surface Study, T. Kakiuchi, S. Hashimoto, N. Fujita, K. Mase, M. Tanaka, M. Okusawa, 10th International Conference on Synchrotron Radiation Instrumentation, 20090900
  • 20090327
  • 20090109
  • 20081204
  • Hydrogen Ion Desorption from Amorphous Carbon Films Induced by Resonant Core Electron Excitations, Y. Mera, S. Liang, T. Fujiwara, K. Ishizaki, T. Kakiuchi, K. Mase, E. Kobayashi, K. K. Okudaira, K. Maeda, 4th Vacuum and Surface Sciences Conference of Asia and Australia , 20081028
  • Local Valence Electronic States of SiO2 Ultrathin Films Grown on Si(100) and Si(111) Studied UsingAuger Photoelectron Coincidence Spectroscopy (APECS), T. Kakiuchi, N. Fujita, K. Mase, M. Tanaka, 4th Vacuum and Surface Sciences Conference of Asia and Australia, 20081028
  • 20081027
  • 20080924
  • 20080920

Misc

  • Surface- and Interface-Selective Local Valence Electronic States of Ultrathin Hafnium Silicide Films Deposited on Clean Si(110) Surface, T. Kakiuchi, M. Yamasaki, K. Mase, PF Act. Rep. 2016, 34, 20170000
  • Auger electron spectra of hydrogenated Si(111)-1×1 surface obtained from Si-L23Vv Auger electron Si-2p photoelectron coincidence measurements, T. Yamazaki, S. Hashimoto, T. Kakiuchi, K. Mase, and M. Tanaka, J. Phys.: Conference Series, 288, 012016 (1), 012016 (5), 20110000
  • Silicon Single Crystal Wafer Holder with a Cold Trap and a Direct Current Heating Mechanism Mounted on a Con‰at Flange with an Outer Diameter of 70 mm , E. Kobayashi, A. Nambu, T. Kakiuchi, K. Mase, J. Vac. Soc. Jpn., 50, 57, 59, 20071000, 10.3131/jvsj.50.57
  • Titanium Dioxide (TiO2) Single Crystal Holder with a Cold Trap and a Heating Mechanism Mounted on a Con‰at Flange with an Outer Diameter of 70 mm , T. Kakiuchi and K. Mase, JJ. Vac. Soc. Jpn., 51, 44, 47, 20081000, 10.3131/jvsj2.51.44
  • A, 55, 20070000
  • Quantum effect in regeneration reaction of Vitamin E , S. Nagaoka, A. Ouchi、T. Kakiuchi, K. Ohara, K. Mukai, The Vitamin Society of Japan, 83, 9, 521, 527, 20090900, 10.20632/vso.83.9_521
  • 27, 3, 37, 20090000
  • Kinetics of the reaction by which natural vitamin E is regenerated by vitamin C, ElsevierChem. Phys. Lipids, 146, 26, 32, 20070000, 10.1016/j.chemphyslip.2006.12.001
  • Silicon single crystal wafer holder with a cold trap and a direct heating mechanism mounded on a conflat flange with an outer diameter of 70 mm, Shinku, 50, 1, 57, 59, 20070000, 0559-8516|1880-9413, 10.3131/jvsj.50.57
  • Titanium dioxide (TiO2) single crystal holder with a cold trap and a heating mechanism mounted on a conflat flange with an outer diameter of 70 mm, J. Vac. Soc. Jpn., 51, 44, 47, 20080000
  • Development of an Electron Electron Ion Coincidence Apparatus for Auger-Photoelectron Coincidence Spectroscopy (APECS) and Electron Ion Coincidence (EICO) Spectroscopy, Photon FactoryPF Activity Report 2006, Part A, Highlights 55, A, 55, 20070000
  • Surface-site-selective study of valence electronic states of a clean Si(111)-7×7 surface using Si-L23VV Auger electron and Si-2p photoelectron coincidence measurements, American Physical SocietyPhysical Review B, 83, 035320, 20110000

Other Research Activities

Others

  • 20170400
  • 20161200
  • 20130400
  • 20110600
  • 20110400
  • 20150400


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